Special thanks to:
(Elsevier, Science Direct, Springer, Springer Nature, Wiley, Taylor & Francis, Nature Publishing Group (Nature journals), Oxford University Press, Cambridge University Press, SAGE Publications, CRC Press, Pearson Education, McGraw Hill, Cengage, Wolters Kluwer, IEEE Standards Association, Institute of Electrical and Electronics Engineers (IEEE), Association for Computing Machinery, American Chemical Society (ACS), Royal Society of Chemistry (RSC), Society for Industrial and Applied Mathematics (SIAM), American National Standards Institute, American Society of Mechanical Engineers, American Society of Civil Engineers, ASTM International, NFPA, Brazilian National Standards Organization, SAGE Journals, ProQuest, JSTOR, Emerald, Scholastic, Macmillan Learning, Hodder & Stoughton, MDPI, PLOS (Public Library of Science), Cambridge Scholars Publishing, Google Scholar, Scopus (Elsevier), Web of Science (Clarivate), DOAJ, arXiv, bioRxiv, medRxiv, EBSCOHost)